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DX-30 Permanent Magnet Hall Effect Test System
The experimental results are automatically calculated by the software, and the Bulk Carrier Concentration, Sheet Carrier Concentration, Mobility, Resistivity, Hall Coefficient (Hall) can be obtained at the same time. Coefficient), magnetoresistance (Magnetoresistance) and so on.
contact nowDX-30 Permanent Magnet Hall Effect Test System
System composition:
This instrument system is composed of permanent magnet, high-precision constant current source, high-precision voltmeter, Hall effect sample holder, standard sample, high-precision Gauss meter and system software. The DX-320 effector specially developed for this instrument system integrates a constant current source, a six-and-a-half-digit microvoltmeter and a complex switching relay-switch for Hall measurement into a whole, which greatly reduces the connection and operation of the experiment. DX-320 can be used as a constant current source and a microvoltmeter alone. It is used to measure important parameters such as carrier concentration, mobility, resistivity, and Hall coefficient of semiconductor materials. These parameters must be controlled in advance to understand the electrical characteristics of semiconductor materials. Therefore, the Hall effect test system is to understand and study semiconductor devices. And a necessary tool for the electrical properties of semiconductor materials. The experimental results are automatically calculated by the software, and the Bulk Carrier Concentration, Sheet Carrier Concentration, Mobility, Resistivity, Hall Coefficient (Hall) can be obtained at the same time. Coefficient), magnetoresistance (Magnetoresistance) and so on.
Testable materials:
Physical parameters | Carrier Density | 103cm-3 ~ 1023cm-3 |
Mobility | 0.1cm2/volt*sec ~108cm2/volt*sec | |
Resistivity | 10-7 Ohm*cm~1012 Ohm*cm | |
Hall voltage | 1uV ~ 3V | |
Hall index | 10-3 ~ 106cm3/C | |
Testable material type | semiconductors | SiGe, SiC, InAs, InGaAs, InP, AlGaAs, HgCdTe and ferrite materials, etc. |
Low impedance material | Graphene, metal, transparent oxide, Weak magnetic semiconductor materials, TMR materials, etc. | |
High-impedance material | Semi-insulating GaAs, GaN, CdTe, etc. | |
Material conductive particles | P-type and N-type testing of materials | |
Magnetic field environment | Magnet type | Nuclear magnetic resonance NMR series permanent magnets |
Magnetic field size | 500mT (The distance between the poles: 18mm) | |
Optional magnetic environment | Permanent magnets with relevant magnetic sizes can be customized according to customer needs | |
Electrical parameters | Battery | 50.00nA-50.00mA |
Current source resolution | 0.0001uA | |
Measuring voltage | 0~±3V | |
Voltage measurement resolution | 0.0001mV | |
Temperature environment | Room temperature | |
Other Accessories | Shading | Externally install shading parts to make the test material more stable |
Sample size | Maximum 30mm*30mm | |
Test sample | Provide Hall Effect from Institute of Semiconductors, Chinese Academy of Sciences Standard test samples and data: 1 set (Silicon, germanium, gallium arsenide, indium antimonide) | |
Making ohmic contacts | Electric soldering iron, indium sheet, solder, enameled wire, etc. |
Sample Test Typical Example
Instrument introduction:
Item No. | Name | Technical Specification |
001 | DX-100 Electromagnet | 1. Both ends are high-stability permanent magnets, and the magnetic field value is: 500mT up and down (the specific value is subject to actual measurement) 2. The distance between the pole heads of the two permanent magnets: 18mm, the pole diameter: 48mm, and the pole face diameter: 33mm 3. The permanent magnet is a nuclear magnetic resonance NMR series permanent magnet with good stability and very uniform magnetic field, ensuring that the uniformity of the uniform zone is 1~5*10-5 4. Permanent magnets with relevant magnetic sizes can be customized according to customer needs to cooperate with the Hall effect test experiment |
002 | DX-320 Sample constant current source | 1. The basic resolution of current output is 0.0001uA, and the basic resolution of voltage measurement is 0.0001mV 2. Output range: 50.00nA-50.00mA can be continuously adjustable in steps of 0.1nA 3. Measuring voltage: 0~±3V large range test voltage meets the test of high resistance chip 4. Built-in four-phase array card with automatic conversion, which can realize automatic measurement of Hall effect van der Pauw method 5. Good human-computer interaction interface, convenient for users to make manual adjustments 6. Complete host computer instructions, which can communicate with the computer to complete various operations |
003 | DX-35 Sample stage | 1. The sample table can support 30*30mm size samples for testing 2. The pressure point of the four-probe method makes the operation and the contact of the sample more convenient and firm 3. The shading parts are installed outside to make the test material more stable 4. The sample stage is fixed on the permanent magnet bracket, so that the sample is in the same position each time, ensuring better measurement repeatability 5. The pin of the sample stage is connected with the CH-320 instrument through the wire to realize the stable measurement of the Van der Pauw method |
004 | PC software | 1. One-key automatic measurement can be realized. After the test starts, the tester must reverse the polarity of the permanent magnet according to the program prompts to perform the measurement. 2. Carry out the parameter setting of the relevant test samples in the software, and realize the automatic calculation of each parameter after the test is completed 3. I-V curve and B-V curve can be performed in the software 4. The modular design in the software is convenient for customers to use and the development of related functions. 5. After the experimental results are measured, the data will be temporarily stored in the software. If long-term storage is required, the data can be exported to the EXCEL table, which is convenient for later data processing |
005 | Supporting equipment | 1. Permanent magnet fixing device, so that the magnet is fixed in the same position every time you operate 2. Provide Hall-effect standard test samples and data from the Institute of Semiconductors of the Chinese Academy of Sciences: 1 set 3. The corresponding tools for making ohmic contact solder joints on the sample: electric soldering iron, indium sheet, solder, enameled wire, etc. 4. 232 to USB serial line to realize the communication between the test instrument and the host computer software |
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